Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
11016458 | Microelectronics Reliability | 2018 | 6 Pages |
Abstract
PN-junction diodes with different breakdown voltages have been subjected to surge pulses per the standard IEC 61000-4-5 and their transient behaviour has been studied. For medium breakdown voltages (20-40â¯V) at high surge currents large transient oscillations in the voltage drop across the diodes are observed. After such an event, the devices are still operational. 3D electro-thermal TCAD simulations have been done to understand the phenomenon. A comparison between measurement and simulation reveals that the periodic voltage drop is caused by non-destructive second breakdown.
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Hardware and Architecture
Authors
Steffen Holland, Rolf Brenner,