Article ID Journal Published Year Pages File Type
11016516 Microelectronics Reliability 2018 6 Pages PDF
Abstract
During the last years applications for power modules with harsh environmental conditions have gained increasing importance. Static humidity tests with T = 85 °C and RH = 85% with high voltage have established as basic testing method for the humidity robustness of semiconductor power modules. The present work is showing the improvement of humidity robustness with respect to the established test methods. Electrical performance monitoring and analytic approaches to prove the results with respect to established work on the field of humidity testing.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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