Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
11016516 | Microelectronics Reliability | 2018 | 6 Pages |
Abstract
During the last years applications for power modules with harsh environmental conditions have gained increasing importance. Static humidity tests with Tâ¯=â¯85â¯Â°C and RHâ¯=â¯85% with high voltage have established as basic testing method for the humidity robustness of semiconductor power modules. The present work is showing the improvement of humidity robustness with respect to the established test methods. Electrical performance monitoring and analytic approaches to prove the results with respect to established work on the field of humidity testing.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
S. Kremp, O. Schilling,