Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1149060 | Journal of Statistical Planning and Inference | 2006 | 25 Pages |
Abstract
In this paper, we consider inference based on very general divergence measures under assumptions of a logistic regression model. We use the minimum φφ-divergence estimator in a φφ-divergence statistic, which is the basis of some new statistics, for solving the classical problems of testing in a logistic regression model. A diagnostic analysis is developed based on the new estimators and test statistics.
Related Topics
Physical Sciences and Engineering
Mathematics
Applied Mathematics
Authors
Julio Angel Pardo, Leandro Pardo, María del Carmen Pardo,