Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1286995 | Journal of Power Sources | 2006 | 6 Pages |
Dense La0.8Sr0.2MnO3 (LSM) and La0.5Sr0.5CoO3 (LSC) films were fabricated via pulsed laser deposition (PLD) on different substrates. The crystal structures of the films were characterized via in situ X-ray diffraction and the in-plane electrical properties by impedance spectroscopy from room temperature to 700 °C. While the ablated films appeared to grow in the perovskite phase with the appropriate electrical properties when the substrate temperature was greater than 500 °C, they were amorphous when the substrate temperature was relatively low. Subsequent annealing of amorphous LSM and LSC films in air induced a rapid phase transformation to the perovskite phase. On silicon substrates, this phase transformation occurred at 450 and 600 °C, respectively.