Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1287309 | Journal of Power Sources | 2006 | 6 Pages |
Abstract
Preferred c-axis oriented LiCoO2 thin films were prepared on a Si substrate by pulsed laser deposition (PLD). The chemical diffusion coefficients, D˜Li, of Li in these films were measured by electrochemical impedance spectroscopy (EIS) and potentiostatic intermittent titration technique (PITT). D˜Li was found to be in the range of 10−11 to 10−13 cm2 s−1 depending on Li concentration and on the characterization method used.
Related Topics
Physical Sciences and Engineering
Chemistry
Electrochemistry
Authors
Hui Xia, Li Lu, G. Ceder,