Article ID Journal Published Year Pages File Type
1287309 Journal of Power Sources 2006 6 Pages PDF
Abstract

Preferred c-axis oriented LiCoO2 thin films were prepared on a Si substrate by pulsed laser deposition (PLD). The chemical diffusion coefficients, D˜Li, of Li in these films were measured by electrochemical impedance spectroscopy (EIS) and potentiostatic intermittent titration technique (PITT). D˜Li was found to be in the range of 10−11 to 10−13 cm2 s−1 depending on Li concentration and on the characterization method used.

Related Topics
Physical Sciences and Engineering Chemistry Electrochemistry
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