Article ID Journal Published Year Pages File Type
1289811 Journal of Power Sources 2009 4 Pages PDF
Abstract

A study of ionic transference numbers in fluorite-based doped bismuth oxides of general formula Bi3.5Nb1−xYxO7.75−x (0.0 ≤ x ≤ 0.8) measured using a modified EMF method is presented. The modified method appears to yield transference numbers that are more consistent with the observed behaviour in a.c. impedance spectra compared to classical EMF methods. The results show that niobium-rich compositions have a significant electronic contribution to total conductivity at lower temperatures, but that at elevated temperatures above ca. 600 °C the electronic contribution is negligible. Yttrium doping yields almost pure ionic conductors at all temperatures studied. This is explained with reference to structural features in terms of a disruption of electronic conduction pathways.

Related Topics
Physical Sciences and Engineering Chemistry Electrochemistry
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