Article ID Journal Published Year Pages File Type
1290608 Journal of Power Sources 2008 6 Pages PDF
Abstract

LiMn2O4 thin films were deposited on silica glass substrates by radio frequency (RF) magnetron sputtering. The films were characterized by X-ray diffraction (XRD) and scanning electron microscope (SEM). Li-ion chemical diffusion coefficients D˜Li were measured by cyclic voltammetry (CV), potentiostatic intermittent titration technique (PITT), electrochemical impedance spectroscopy (EIS) and limiting current density (LCD). The D˜Li values depended on the content of Li in LixMn2O4. It was found that the D˜Li values by CV, PITT and LCD were in the order of 10−10, 10−11 and 10−12 cm2 s−1, respectively, and those by EIS were in the range of 10−9 to 10−11 cm2 s−1. The D˜Li values obtained by above methods were compared with those by an electron blocking method. It turned out that the D˜Li values by the electron blocking method were more comparable with those by EIS.

Related Topics
Physical Sciences and Engineering Chemistry Electrochemistry
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