| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1293274 | Journal of Power Sources | 2011 | 5 Pages |
The shunt current loss is one of main factors to affect the performance of the vanadium redox flow battery, which will shorten the cycle life and decrease the energy transfer efficiency. In this paper, a stack-level model based on the circuit analog method is proposed to research the shunt current loss of the vanadium redox flow battery, in which the SOC (state of charge) of electrolyte is introduced. The distribution of shunt current is described in detail. The sensitive analysis of shunt current is reported. The shunt current loss in charge/discharge cycle is predicted with the given experimental data. The effect of charge/discharge pattern on the shunt current loss is studied. The result shows that the reduction of the number of single cells in series, the decrease of the resistances of manifold and channel and the increase of the power of single cell will be the further development for the VRFB stack.
► The model of shunt current loss is proposed. ► The sensitive analysis of shunt current is carried out. ► Shunt current loss is less than 17% in coulomb loss at the given experiment. ► Increasing power of single cell can reduce the influence of shunt current loss.
