Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
461340 | Microprocessors and Microsystems | 2015 | 9 Pages |
Abstract
A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fourth fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs.
Related Topics
Physical Sciences and Engineering
Computer Science
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Authors
Jaak Kõusaar, Raimund Ubar, Sergei Devadze, Jaan Raik,