Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971184 | Microelectronics Journal | 2017 | 10 Pages |
Abstract
This paper presents a two-step pulse-shrinking time-to-digital converter (TDC) consisting of a 4-stage coarse pulse-shrinking TDC with per-stage shrinkage 1Â ns and a 4-stage fine pulse-shrinking TDC with per-stage shrinkage 250Â ps. A simple residual time extraction scheme is proposed to extract the residual pulse of the coarse TDC. The characteristics of the TDC including mismatch and noise-induced timing errors, timing errors of delay blocks, conversion time, power consumption, and silicon consumption are analyzed in detail. The proposed TDC was implemented in an IBM 130Â nm 1.2Â V CMOS technology. Simulation results show that the proposed TDC offers 1.4Â ns conversion time, 1 LSB DNL and INL, and figure-of-merit (FoM) of 0.163Â pJ/step. Some measurement results of the proposed TDC are also presented.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Young Jun Park, Fei Yuan,