Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971240 | Microelectronics Journal | 2017 | 6 Pages |
Abstract
A SPICE macro-model constructed of 3-series-connected-transistors is proposed to describe the IV behavior of a 2-bits/cell split-gate flash memory cell for the first time. The model features 3 different memory states of the cell, namely '11â², '10â² and '01â² at different temperatures (â40 to 125 °C). The cell is constructed of a select-gate transistor in the center with two symmetrical floating gate transistors in two sides. Using the method of capacitive coupling, the model describes the floating gate transistor with BSIM4 (level=54) model with the floating gate voltages changed into a linear combination of the control gate voltage and the select gate voltage. All the BSIM model parameter extraction strategies are applicable for the extraction flow. This novel 2-bits/cell split-gate flash memory cell is fabricated by a 90 nm 4-poly 4-metal CMOS process of Shanghai Huahong Grace Semiconductor Manufacturing Corporation.
Keywords
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Xiaonian Liu, Yiran Xu, Xiangquan Fan, Mengxing Liao, Pingliang Li, Shichang Zou,