Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971466 | Microelectronics Reliability | 2017 | 4 Pages |
Abstract
Junctions between energetically deposited graphitic carbon and n-type 6H-SiC have been fabricated. Their current-voltage characteristics have been measured and compared with simulations using Sentaurus TCAD finite element software. Agreement between the experimental and simulated current-voltage characteristics was achieved using parameters derived from electrical measurements and electron microscopy. Using the best-fit models, the effects of interfacial layers and contact work function variations were elucidated to provide guidance for improved device performance.
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Authors
Hiep Tran, Masturina Kracica, Dougal McCulloch, Edwin Mayes, Anthony Holland, James Partridge,