Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971519 | Microelectronics Reliability | 2017 | 6 Pages |
Abstract
Fig. 7 gives out the distribution of the maximum output power for three substrings in one module from module 1 to 17 under STC. From Fig. 7, we found that the maximum power of three substrings in one module from No. 1 to No. 9 under STC is nearly the same after one year's operation, and that the degradation degree of maximum power for three substrings in one module from No. 10 to No. 17 under STC is different. The closer to the negative pole of module string the substring is, the more the degradation of maximum power for three substrings in one module is.176
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Hong Yang, Fumei Wang, He Wang, Jipeng Chang, Dengyuan Song, Chengfeng Su,