Article ID Journal Published Year Pages File Type
4971569 Microelectronics Reliability 2017 5 Pages PDF
Abstract
In this paper, we propose a methodology that combines the two approaches to get an improved reliability estimation and allows for a gradual improvement from a prediction handbook based approach to a PoF based reliability assessment. This methodology has been successfully validated on an industrial case.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Authors
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