Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971569 | Microelectronics Reliability | 2017 | 5 Pages |
Abstract
In this paper, we propose a methodology that combines the two approaches to get an improved reliability estimation and allows for a gradual improvement from a prediction handbook based approach to a PoF based reliability assessment. This methodology has been successfully validated on an industrial case.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A.B. Temsamani, S. Kauffmann, Y. Descas, B. Vandevelde, F. Zanon, G. Willems,