| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4971600 | Microelectronics Reliability | 2017 | 13 Pages |
Abstract
- Failure analysis on product scan chain failure flow overview
- Full CAD navigation suite software for failure analysis
- Optimization of diagnosis tools for success rate for scan chain failures
- New pattern generation for diagnosis improvement and fault isolation
- State of the art for use of emission microscopy and laser technic for scan chain failures
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Etienne Auvray, Paul Armagnat, Luc Saury, Maheshwaran Jothi, Michael Brügel,