| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4971605 | Microelectronics Reliability | 2017 | 5 Pages |
Abstract
This publication introduces (spectral) photon emission (PEM) and electro-optical frequency mapping (EOFM/LVI) measurements to analog circuit elements (simple, cascode and low-voltage current mirrors). Different operating conditions of the devices are probed and the voltage dependence of the signals is analyzed. Results partly show close similarities to optical probing of digital IC's, but also differences in voltage dependence and signal levels due to more complicated voltage and signal distributions along the devices.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
I. Vogt, T. Nakamura, C. Boit,