Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971640 | Microelectronics Reliability | 2017 | 5 Pages |
Abstract
By using the modified FA flow in such cases, the actual failure root cause can be diagnosed and the potential sources can be traced back. Finally, the identified sources as well as other potential sources throughout the material supply chain and manufacturing process can be eliminated. Structural application of this improved way of working has led to a breakthrough in our Automotive zero-defect roadmap.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Rik J. Otte, Rob F. Fonville, Martin D. Knotter,