Article ID Journal Published Year Pages File Type
4971640 Microelectronics Reliability 2017 5 Pages PDF
Abstract
By using the modified FA flow in such cases, the actual failure root cause can be diagnosed and the potential sources can be traced back. Finally, the identified sources as well as other potential sources throughout the material supply chain and manufacturing process can be eliminated. Structural application of this improved way of working has led to a breakthrough in our Automotive zero-defect roadmap.
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Physical Sciences and Engineering Computer Science Hardware and Architecture
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