Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971642 | Microelectronics Reliability | 2017 | 6 Pages |
Abstract
Experimental evidences have been collected as first step on advanced CMOS technologies, and their extension to the smart-power families, where digital and power coexist together, will be shortly discussed in this paper.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
R. Enrici Vaion, M. Medda, A. Mancaleoni, G. Mura, A. Pintus, M. De Tomasi,