Article ID Journal Published Year Pages File Type
4971707 Microelectronics Reliability 2016 8 Pages PDF
Abstract
A new SCR with the variation lateral base doping (VLBD) structure (VSCR) is proposed to improve the turn-on speed for electrostatic discharge (ESD) protection. The turn-on speed of the SCR was determined mainly by the base transit time of the parasitic p-n-p and n-p-n transistors of the SCR, and the VLBD structure can reduce the base transit time of the bipolar transistors to improve the turn-on speed of the SCR. The experimental and simulation results show that the turn-on time of the VSCRs with the VLBD structure is 12% less than that of the MLSCR with the traditional uniform base doping without adding extra process masks and increasing the chip area.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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