Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971844 | Microelectronics Reliability | 2016 | 5 Pages |
Abstract
In this paper a novel, and straightforward, method is proposed to determine the moisture absorption under pressurized conditions. To verify the method, data obtained under pressurized conditions is compared to behavior under standard conditions. Under autoclave conditions it is shown that the moisture uptake at higher temperatures is much higher than predicted by extrapolation. The reported data can also be used to predict more reliably the moisture saturation level, and rate of moisture saturation during HAST.
Keywords
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
A. Mavinkurve, J.L.M. Llacer Martinez, M. van Soestbergen, J.J.M. Zaal,