Article ID Journal Published Year Pages File Type
4971844 Microelectronics Reliability 2016 5 Pages PDF
Abstract
In this paper a novel, and straightforward, method is proposed to determine the moisture absorption under pressurized conditions. To verify the method, data obtained under pressurized conditions is compared to behavior under standard conditions. Under autoclave conditions it is shown that the moisture uptake at higher temperatures is much higher than predicted by extrapolation. The reported data can also be used to predict more reliably the moisture saturation level, and rate of moisture saturation during HAST.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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