Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4971858 | Microelectronics Reliability | 2016 | 4 Pages |
Abstract
For measurement of electrical characteristics it is essential to supply an electrical current or apply a voltage to the circuit. This study have been carried in order to realize the creation of a stable electrical current flow in the microscopic region only by using the charged particle beams, without requiring contact of the mechanical probes. And it was revealed that stable and constant current flow can be achieved in a self-aligned current-controlling manner by utilizing the secondary electrons. We also have clarified that the mechanism of stabilizing current in a self-aligned manner is dependent on space charge limited current of secondary electrons.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
J. Ma, Y. Fujimura, M. Utsumi, S. Tomonaga, Y. Mashiko,