Article ID Journal Published Year Pages File Type
4971888 Microelectronics Reliability 2016 5 Pages PDF
Abstract
The thermal properties and reliability of novel heatsinks that use high thermal conductivity graphite were investigated. Graphite plates with different high-thermal-conductivity directions were laminated together using an Ag-based brazing material, with thin Cu plates on their outer surfaces. The heatsinks were bonded to Si heater chips using Sn-3Ag-0.5Cu solder. Samples with conventional Cu or Cu-65Mo heatsinks were also fabricated as references. The samples were attached to an active cooling plate subjected to a constant water flow, and thermal and reliability measurements were conducted. The experimental results were also compared with the results of a finite element analysis. The novel laminated heatsinks exhibited a lower thermal resistance than the Cu or Cu-65Mo heatsinks, and the experimental results were in reasonable agreement with those of the finite element analysis. The graphite-based heatsinks had better power cycle reliability than Cu-based heatsinks. Therefore, these novel graphite heatsinks have potential for application to power semiconductor modules, it seems to be useful for applications with high heat flux of power semiconductor devices.
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Physical Sciences and Engineering Computer Science Hardware and Architecture
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