| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4971893 | Microelectronics Reliability | 2016 | 6 Pages |
Abstract
This paper describes production process optimizations, thermal optimization possibilities, power cycling lifetime measurements and first conductive anodic filament lifetime measurements at 1000Â VÂ DC. The outlook onto an integrated 120Â A 700Â V SiC MOSFET demonstrator is given.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
R. Randoll, W. Wondrak, A. Schletz,