Article ID Journal Published Year Pages File Type
4971894 Microelectronics Reliability 2016 5 Pages PDF
Abstract
The demands on reliable and fault tolerant power electronic devices are increasing. One opportunity to increase the IGBT short circuit ruggedness is to modify the thermal capacitance and the thermal resistance close to the chip and hence extend the possible short circuit duration. Therefore simulations with different metallization, bond wire and chip interconnect materials are compared to identify the most promising solution for enhancing short circuit capability of IGBTs.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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