Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
541407 | Microelectronics Journal | 2014 | 9 Pages |
Abstract
A capacitive calibration digital-to-analog converter (CDAC) is commonly used to reduce the mismatch-induced linearity errors for successive approximation register (SAR) analog-to-digital converters (ADC) employing capacitor arrays. There are complicated design considerations in determining the number of bits, the unit capacitor value and even the parasitic capacitors of the CDAC, as these factors affect or are determined by the achievable ADC resolution, the main DAC's capacitance, and the main DAC unit capacitance value, etc. This paper is the first to present a systematic analysis on these relationships. The analysis is validated by behavioral and circuit simulation results.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Lei Sun, Kong-Pang Pun,