Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
542229 | Microelectronics Journal | 2008 | 8 Pages |
Abstract
A thermal model based on the polynomial relationship of ns and EF is presented. The effect of temperature rise due to self-heating is studied on various parameters viz. polarization, electron mobility, velocity saturation, low-field mobility and thermal conductivity of substrate. Parasitic resistances and channel length modulation were also taken into consideration. The relationship between self-heating effect and device parameters was studied. The model is based on closed-form expressions and does not require elaborate computation. After including self-heating effect in calculations of current–voltage characteristics, our results agreed well with published experimental data.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Manju K. Chattopadhyay, Sanjiv Tokekar,