Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
542275 | Microelectronics Journal | 2007 | 5 Pages |
Abstract
We used simple microelectromechanical systems (MEMS) technology to fabricate low-voltage-controlled variable capacitors with high-quality factor. The surface profile of the variable capacitor at different values of applied voltage is measured using WYKO NT1100 optical surface profiler. The pull-in voltage of the variable capacitor was below 15 V. The capacitance and quality factor at 1 GHz are 0.792 and 51.6 pF. The pull-in voltage is 13.5 V, the tuning ratio of the capacitor is more than 1.31:1.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Dong-Ming Fang, Shi Fu, Ying Cao, Yong Zhou, Xiao-Lin Zhao,