Article ID Journal Published Year Pages File Type
542275 Microelectronics Journal 2007 5 Pages PDF
Abstract

We used simple microelectromechanical systems (MEMS) technology to fabricate low-voltage-controlled variable capacitors with high-quality factor. The surface profile of the variable capacitor at different values of applied voltage is measured using WYKO NT1100 optical surface profiler. The pull-in voltage of the variable capacitor was below 15 V. The capacitance and quality factor at 1 GHz are 0.792 and 51.6 pF. The pull-in voltage is 13.5 V, the tuning ratio of the capacitor is more than 1.31:1.

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Physical Sciences and Engineering Computer Science Hardware and Architecture
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