| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 542345 | Microelectronics Journal | 2009 | 12 Pages |
Abstract
Nonideal factors which play a key role in performance and yield in high-precision operational amplifiers are rigorously investigated. Expressions for the offset voltage (Vos) and the common-mode rejection ratio (CMRR) are derived and correlated. The mismatch accuracy is analyzed for different transistor geometries in a CMOS OTA (operational transconductance amplifier) in 0.35 μm technology by using the Monte Carlo approach.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Juan Pablo Martinez Brito, Sergio Bampi,