Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
542721 | Microelectronics Journal | 2006 | 4 Pages |
Abstract
This letter reports a new current versus voltage model for light-emitting devices with a quantum well where electrons and holes are injected and recombine. The current is entirely caused by the recombination of electrons and holes. Historically, the equation used for light-emitting diodes (LEDs) and laser diodes (LDs) has been the renowned Sah-Noyce-Shockley (SNS) diode equation. In this equation at typical forward bias condition, most of the current is caused by the diffusion of carriers over the depletion region. It is clear that this condition is different from what actually happen in LEDs and LDs. We thus looked into the fundamental of carrier transport and developed a new model for devices with a quantum well. Based on the new model, calculated I-V curves agree well with measurement results of GaN/sapphire LEDs with GaInN quantum wells. In calculation, junction temperature Tj rather than case temperature Tc is used to achieve better agreement.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Chin C. Lee, Winnie V. Chen, Jeong Park,