| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 543481 | Microelectronics Journal | 2012 | 8 Pages |
Abstract
This paper exploits a universal current-based definition of the threshold voltage (VT) and discusses some direct methods to measure it. The consistency, accuracy, and sensitivity of the extraction procedures to second-order effects are examined through numerical simulations and experimental measurements. In addition to three procedures based on dc current measurements we propose an automatic VT-extractor circuit which allows the direct determination of the threshold voltage with minimum influence of second-order effects.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Osmar Franca Siebel, Marcio Cherem Schneider, Carlos Galup-Montoro,