Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
543781 | Microelectronics Journal | 2009 | 4 Pages |
Abstract
Hard–soft systems with magnetic transition metal electrodes and ZnO barrier of variable thickness have been epitaxially grown by pulsed laser deposition on MgO(1 0 0) substrates. The structural reflection high-energy electron diffraction (RHEED) and X-ray diffraction (XRD) analysis have shown an epitaxial growth of the CoFe2 bottom electrode, the permalloy top electrode and of the ZnO barrier. Magnetic measurements have shown a clear plateau with a separate reversal of both magnetizations of the top and bottom electrodes, which is promising for further tunnel magnetoresistance measurements. A ferromagnetic coupling between the magnetic electrodes through the barrier has been observed.
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Authors
H. Bieber, G. Versini, S. Barre, J.-L. Loison, G. Schmerber, C. Ulhaq-Bouillet, S. Colis, A. Dinia,