An operational amplifier model for evaluating test strategies at behavioural level

This paper proposes a new operational amplifier model for evaluating test strategies at behavioural level. Major modifications on a previously reported model for improving its performance and for allowing reliable fault simulations are presented here. The new model presents a set of very appealing characteristics for behavioural-level fault injection and simulation.The matching between the behavioural-level model and a transistor-level one is evaluated for validating the model. We suggest the use of the model early in the design process, when the schematic of the circuit is not available for the test engineer and only the specifications are given. The model is also useful for evaluating different test alternatives for commercial operational amplifiers or standard cells designed by others vendors. The paper addresses two application examples and shows the usefulness of the model for evaluating test strategies when only the specifications of the circuit are available.