Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
544700 | Microelectronics Reliability | 2015 | 6 Pages |
Abstract
This work presents a study of the effects of the leakage currents in the control transistors of a dynamic storage cell intended to be used with Bulk-BICS circuits. A means to introduce a controlled discharge current to the storage element is presented, making the dynamic storage cell stable in the reset-state at rest. This self-reset feature allows eliminating the recurrent reset pulse necessary in the previous version for stabilization of the memory cell. A reduction in the current consumption when the circuit is idle is also achieved with this technique.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Alexandre Simionovski, Gilson Wirth,