Article ID Journal Published Year Pages File Type
544992 Microelectronics Reliability 2014 4 Pages PDF
Abstract

•An 8-level 3-bit cell programming technique is presented in SONOS memory devices.•This new programming mode enlarges one time programming and sensing window.•The storage density of the 8-level cell is greatly improved.•The cycling endurance and retention properties are not obviously degraded.

An 8-level 3-bit cell programming technique is presented in NOR-type nano-scaled polycrystalline silicon-oxide–nitride-oxide-silicon (SONOS) memory devices. This new operating mode provides the double programming and sensing window over the traditional 4-level cell programming by using a double-side hot hole injection erasing. Compared with the 4-level cell, the storage density of the 8-level cell is greatly improved. However, the cycling endurance and retention properties are not obviously degraded until 1000 program/erase cycling.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Authors
, , , ,