Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
544992 | Microelectronics Reliability | 2014 | 4 Pages |
•An 8-level 3-bit cell programming technique is presented in SONOS memory devices.•This new programming mode enlarges one time programming and sensing window.•The storage density of the 8-level cell is greatly improved.•The cycling endurance and retention properties are not obviously degraded.
An 8-level 3-bit cell programming technique is presented in NOR-type nano-scaled polycrystalline silicon-oxide–nitride-oxide-silicon (SONOS) memory devices. This new operating mode provides the double programming and sensing window over the traditional 4-level cell programming by using a double-side hot hole injection erasing. Compared with the 4-level cell, the storage density of the 8-level cell is greatly improved. However, the cycling endurance and retention properties are not obviously degraded until 1000 program/erase cycling.