| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 545016 | Microelectronics Reliability | 2013 | 6 Pages |
Abstract
A product qualification gave very different results for CDM testing between three labs. This paper describes the investigation into the root cause of these differences. The most relevant issues are the measurement bandwidth and the quality of the calibration modules. An improved procedure is proposed.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
T. Smedes, M. Polewski, A. van IJzerloo, J.L. Lefebvre, M. Dekker,