Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies

The use of deeper-submicron technologies in integrated circuits worsens the effects of transient faults. In fact, the transient-fault durations become as important as the clock periods of synchronous circuits. Electronic systems are thus more vulnerable to failure situations. Nevertheless, this paper shows innovatively that such a worse scenario does not happen in asynchronous circuits. This additional novel benefit pushes on the asynchronous design as a better alternative to mitigate transient faults in deep-submicron technology-based circuits.