Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
545306 | Microelectronics Reliability | 2011 | 6 Pages |
Abstract
This paper presents a novel approach for health monitoring of electronic products using the Mahalanobis distance (MD) and Weibull distribution. The MD value is used as a health index, which has the advantage of both summarizing the multivariate operating parameters and reducing the data set into a fused distance index. The Weibull distribution is used to determine health decision metrics, which are useful in characterizing distributions of MD values. Furthermore, a case study of notebook computer health monitoring system is carried out. The experimental results show that the proposed method is valuable.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Gang Niu, Satnam Singh, Steven W. Holland, Michael Pecht,