Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
545374 | Microelectronics Reliability | 2010 | 4 Pages |
Abstract
A hydrogen sensor based on a metamorphic high electron mobility transistor (MHEMT) is fabricated and investigated. It is found that the applied gate–source voltage plays an important role in sensor performance. A highest sensing response is found to be 68% at the applied gate–source voltage of −0.6 V under exposing to a 1% H2/air. While the applied gate–source voltage is fixed at 0 V, the large magnitude of drain current variation of 1.8 mA is observed. However, the higher current variation accompanies higher power consumption. Thus, a trade-off between the sensor performance and power consumption should be considered.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Tsung-Han Tsai, Huey-Ing Chen, Kun-Wei Lin, Tai-You Chen, Chien-Chang Huang, Kai-Siang Hsu, Wen-Chau Liu,