Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
545450 | Microelectronics Reliability | 2009 | 5 Pages |
Abstract
This tutorial discusses several ways of ESD testing for devices, ICs and systems. A good understanding of the methods and the physics is required for relating test results to each other. The tutorial ends with an outlook on extensions of the current methods and a discussion on required ESD qualification levels.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
T. Smedes,