| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 545454 | Microelectronics Reliability | 2009 | 4 Pages |
Abstract
This paper deals with the study of electromagnetic compatibility prediction of integrated circuits in order to improve their reliability. The study takes place in the context of embedded electronic circuit where the proximity of the analog and digital parts increases. The case of microcontroller is considered and more particularly the susceptibility of the Analog to Digital Converter (ADC) device. The use of the new immunity approach (ICIM-CI model) is proposed to achieve the susceptibility modelling of the ADC. The model is built step by step (functional and coupling path models). Then, it is possible to estimate the effect of disturbances on the sensitive nodes. Finally the aim of EMC circuit compliance is enhanced.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant,