Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
545456 | Microelectronics Reliability | 2009 | 5 Pages |
The reliability of electric cables and wires using electron beam crosslinked polymers as isolator materials strongly depends on the accuracy in predicting the dose deposited during irradiation. This paper presents the main reliability issues that can be encountered in field operation, experimental data showing the criticality of the dose parameter, and proposes the use of a built-in reliability approach based on Monte Carlo simulation to design optimum processing conditions. The main requirements and advantages of the Monte Carlo based methodology are discussed in conjunction with the limitations of the traditional heuristic calculation procedure. Finally, Monte Carlo simulation is used for the first time to point out some relevant effects that occur during processing and that can lead to severe dose estimation errors.