Article ID Journal Published Year Pages File Type
545477 Microelectronics Reliability 2009 5 Pages PDF
Abstract

Time-Dependent Dielectric Breakdown (TDDB) mechanisms remain the key issue to understand in order to enhance the reliability of new capacitors technologies. In this work we tried to model capacitors failure mechanism according to percolation theory, in agreement with the statistical behavior of PZT capacitors times to breakdown (tbd). The role of microstructural defects such as interlayers and cavities in failure mechanism has been emphasized.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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