| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 545489 | Microelectronics Reliability | 2009 | 5 Pages |
Abstract
This paper presents a detailed simulation-based analysis of the influence of the laser spot shape and size on the parametric and logical transient errors that can be injected into a digital device. The effect of the impact of a Gaussian laser beam is simulated at the electrical level for different pulse durations. Results illustrate the complex interaction between the electrical function and the laser perturbation, with potential implications for secure circuit design.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
C. Godlewski, V. Pouget, D. Lewis, M. Lisart,