Article ID Journal Published Year Pages File Type
545522 Microelectronics Reliability 2009 4 Pages PDF
Abstract

Debonding of polymer–metal interfaces often involves both interfacial and cohesive failure. This paper extends the investigation of Yao and Qu presented in [Yao Q, Qu J. Interfacial versus cohesive failure on polymer–metal interfaces in electronic packaging – effects of interface roughness. J Electr Packag 2002;124;127–34] towards a numerical fracture mechanics model that is used to quantitatively predict the relation between cohesive and adhesive failure on a metal–polymer interface. As example, an epoxy–aluminum interface is investigated. The competition between adhesive and cohesive failure depending on surface roughness parameters will be studied. Understanding of these phenomena could enable the optimization of interface properties for different applications.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
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