| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 545728 | Microelectronics Reliability | 2008 | 15 Pages |
Abstract
This paper presents the key reliability issues of lead-free connectors. The paper first discusses electrical contact resistance of lead-free and lead-based solder-dipped contacts under various aging conditions. Then, the fretting corrosion of lead-free contacts is discussed. Finally, the reliability due to tin whiskers induced by mating pressure between connector contact elements is presented.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Tadahiro Shibutani, Ji Wu, Qiang Yu, Michael Pecht,