Article ID Journal Published Year Pages File Type
545779 Microelectronics Reliability 2008 9 Pages PDF
Abstract

We review the literature for reliability- and process-variation aware VLSI design to find that an exciting area of research/application is rapidly emerging as a core topic of IC design. Design of reliable circuits with unreliable components is a significant challenge that is likely to remain relevant for all circuit designs from now on, therefore any contribution in this field is likely to have lasting effect on the design philosophy of integrated circuits.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Authors
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