| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 545824 | Microelectronics Reliability | 2008 | 6 Pages |
Abstract
This paper will give an overview of physical failures that can occur and their effects on emission and OBIRCH analysis. These failure modes will then be correlated to the layout of a device in order to be able to estimate the root cause of a failure based on analysis techniques like emission microscopy and OBIRCH analysis. Finally, we will present case studies of successful failure localization based on layout analysis.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
C. Hartmann, M. Wieberneit,