Voltage-based fault path tracing by transistor operating point analysis

A novel diagnosis technology based on transistor operating point analysis is presented. This technology is the way to detect penetration current net result from fault, replace the net with impedance net, calculate voltage value of each node of the impedance net by OHM’s low, and then sequentially trace the fault logic propagation. The impedance is determined by using transistor dimension and its operating point managed by gate voltage. The proposed method makes it possible to detect not only signal propagation of each gate in order of time, but oscillation phenomenon brought by feedback fault.