| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 545908 | Microelectronics Reliability | 2008 | 8 Pages |
Abstract
It was proposed to classify semiconductor devices into groups of differentiated quality on the basis of their low-frequency noise. The methodology of semiconductor device classification taking into account results of noise investigations of two biased samples was presented.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Alicja Konczakowska,