Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study

Statistical compact modeling (SCM) is necessary for variability aware design at nanometer regime. An extensive study has been carried out to evaluate the impact of the statistical parameter set selection on the statistical accuracy of two widely used industry standard compact models: BSIM4 and PSP. Different statistical parameter generation strategies have been employed to examine the impact of different statistical parameter selection on both device and circuit simulation accuracy.